High-throughput imaging has been the fundamental challenge in scanning probe microscopy techniques (SPM), which is limited by single tip scanning. Korean researchers at Yonsei University report on the design and implementation of an high-throughput SPM technique using cantilever-free probe array and contact-based imaging architecture. The study appears in the journal ‘Nature Communications’ in March. 

 Researchers, led by Prof. Wooyoung Shim, have designed new scanning probe microscopy technique based on cantilever-free probe architecture, called ‘binary-state probe microscopy (BSPM)’.

 Unlike conventional SPM methodology which utilizes continuous interactions between tip and surface for topography measurement, the tip of BSPM senses the surface only in binary states, contacted or non-contacted. This simplified detection method enables to adopt facile probe fabrication based on cantilever-free architecture and measurement instrument based on digital signal. As a results, BSPM can operate 100 tips in parallel, which provide large measurement area over 1 mm2.

 Prof. Shim said that “This study provides an efficient approach for large-area measurement using scanning probe microscopy technique and is also meaningful in terms of securing elemental technology which could be widely applied in the industry.”

[Reference] Kim, G. et al., (2022) “Binary-state scanning probe microscopy for parallel imaging.” Nature Commnunications

[Main Author] Gwangmook Kim (Yonsei University), Wooyoung Shim (Yonsei University)

* Contact : Professor Wooyoung Shim (wshim@yonsei.ac.kr)